Home / AMETEK Surface Vision Names New Vice President

AMETEK Surface Vision Names New Vice President

Jason Zyglis is now their divisional vice president of project and product management.

Posted: August 22, 2018

Jason Zyglis, AMETEK Surface Vision
“Although historically gross defects were deemed challenging, we are now entering the next generation of visual inspection, in which target defects are measured in microns, process speeds exceed 80 mph, and detection defects so subtle the human eye may not be able to resolve them. This accelerating rate of change in surface inspection requirements means we are continually utilizing advanced technology. Now, each system may combine new sensors, lighting advancements, increased data rates, processing power enhancements, and complex defect clarification algorithms."

AMETEK Surface Vision (Hayward, CA; Cognex Surface Inspection Systems Division) appointed Jason Zyglis to the newly created role of divisional vice president of project and product management. The company develops and manufactures software-enabled vision systems used to inspect surfaces of continuously processed materials for flaws and defects.  Its in-line image processing technology detects, classifies, filters, and accurately maps specific defects over the entire surface area. End markets served include metals, paper, nonwovens, plastics and glass, delivering optimized web and surface inspection, monitoring, and process surveillance.

A graduate of the State University of New York College of Environmental Science & Forestry at Syracuse University with a degree in Paper Science (Chemical Engineering), Zyglis transitions from being director of sales for the Americas to his new role to lead the business unit’s product management process and project engineering team. Rising from within the organization, he brings two decades of experience focused on strategic product marketing, sales and business development.

“Although historically gross defects were deemed challenging, we are now entering the next generation of visual inspection, in which target defects are measured in microns, process speeds exceed 80 mph, and detection defects so subtle the human eye may not be able to resolve them,” explained Zyglis. “This accelerating rate of change in surface inspection requirements means we are continually utilizing advanced technology. Now, each system may combine new sensors, lighting advancements, increased data rates, processing power enhancements, and complex defect clarification algorithms.”

ameteksurfacevision.com

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