RFP Fringe Probe Increases 5-Axis Measurement System Flexibility

Renishaw Inc. (West Dundee, IL) increases the REVO 5-axis measurement system’s multisensor capability by adding non-contact structured light inspection via an RFP probe.

The RFP projects a fringe pattern onto the part surface and the probe’s camera captures the variation in fringe pattern to build a point cloud of 3D surface data. The data cloud is then evaluated by the 3D metrology software to provide inspection results. Non-contact structured light inspection with the RFP delivers advantages over tactile probing techniques for freeform surfaces and complex geometry, such as additively manufactured parts, aerospace blades and blisks, automotive cylinder head combustion chambers, and delicate surfaces.

Unlike other non-contact structured light systems, the RFP fringe probe doesn’t  require reference markers to stitch together data from different areas because it’s done automatically by the REVO system. Coating the part in a matt substance is also unneccesary thanks to the automatic exposure compensation of different surface colors, textures and reflectivity, ensuring optimal data results.

Two software tools provide easy-to-use inspection planning and digitizing. The RFP inspection planner is a tool for path planning and generating DMIS part programs from CAD, while the RFP digitizer app guides users around parts without models, collecting data as part of a reverse engineering process.

The RFP probe is automatically and repeatably interchangeable with all other probe options available for the REVO system so data from each sensor shares a common datum reference. This flexibility means the tool can inspect a wide range of features using one coordinate measuring machine (CMM) platform, which is managed by an I++ DME-compliant interface and Renishaw’s MODUS metrology software.

www.renishaw.com