Touch Probes
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New Scanning Technology Achieves up to 50% Reduction in Additive Manufacturing Build Times
Renishaw’s patented TEMPUS technology enhances the class-leading productivity of the RenAM500 series metal additive manufacturing systems with reduced build times, detailed build insights and advanced process monitoring.
New LVDT Probe for High-precision Gaging Applications
Mahr Inc.’s LVDT style measuring probe features a shorter measuring span and higher accuracy for use in dedicated gaging fixtures.
New Portable Surface Measuring Instrument Offers Unparalleled Precision and Mobility
Mahr Inc. introduces the new MarSurf M 410, which provides high precision and accuracy for surface roughness measurements on small and large workpieces.
New Range of Portable Measuring Arms for Rigorous Inspection Applications
LK Metrology has launched a new range of portable 6-axis and 7-axis measuring arms.
Marposs Releases the new Ultra Wideband Transmission Touch Probe System
This high-accuracy touch probe automatically detects the position of machine axes to provide quick and accurate part positioning and tool checking.
Monitoring and Inspection Systems Enhance Analysis and Offer Flexibility
Inspect all of your important parameters and test parts with confidence thanks to enhanced measuring capabilities and products.
Monitoring the Process
Automated measurements of workpieces in machines are progressively more important in today’s manufacturing processes, resulting in shorter production times and fewer interruptions. What’s more, there is more confidence when it comes to the measurement process.
Touch Probes as a Metrology Tool for In-Process Inspection
There are three important features to look for when deciding on a touch probe for in-process use.
Heidenhain Offers New High-Precision Touch Probe for Grinders, Lathes
Offering many benefits, the new TS 750 high-precision touch probe is now available for in-process workpiece measurement in grinding machines and lathes.
Affordably Priced Handheld XRF Analyzer
The Vanta Element from Olympus Scientific Solutions Americas provides the same fast material- and alloy-grade identification as the line’s other models in a rugged, cost-effective package. The 2.9-lb X-ray fluorescence (XRF) analyzer works in temperatures ranging from 14 degrees F to 113 degrees F (-10 degrees C to 45 degrees C).
High-Performance Height Gauge
Mitutoyo America Corp.’s QM-Height Series measures height, height difference (step), inside/outside widths, inside/outside diameters, circle pitch, and free-form surface max/min heights to ±(2.4+2.1L/600) μm. Simple-to-use control panel enables most measurements to be made with one keystroke.
Two Measurement Solutions from Mitutoyo
The multisensor MiSCAN Vision System is a coordinate measuring machine (CMM) with a microscopic-level scanning probe. The compact MiSTAR 555 is a space-saving in-line or near-line CNC CMM designed for high-speed, high-accuracy measurements with assurance from 10° C to 40° C.
